| Relevance of Course Objectives and Core Learning Outcomes(%) |
Teaching and Assessment Methods for Course Objectives |
| Course Objectives |
Competency Indicators |
Ratio(%) |
Teaching Methods |
Assessment Methods |
本課程介紹雙束型聚焦離子束(Dual Beam-FIB)的儀器原理及其應用於材料微結構之分析方法。期藉由本課程的修習讓學生充分了解各項設備的功能，進而活用於其研究工作。
This course introduces the principles of Dual Beam Focused Ion Beam (Dual Beam-FIB) and its applications in the analysis of material microstructure. By completing this course, students will gain a thorough understanding of the functionalities of various equipment, enabling them to effectively apply these tools in their research work.
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| Course Content and Homework/Schedule/Tests Schedule |
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Course Content |
| Week 1 |
雙束型聚焦離子束(Dual Beam-FIB)
-穿透式電子顯微鏡試片製備
-定點剖面與SEM觀察
-離子穿隧影像對比
Dual Beam Focused Ion Beam (Dual Beam-FIB)
-Sample Preparation for Transmission Electron Microscopy (TEM)
-Site-Specific Cross-Sectioning and SEM Observation
-Ion-Tunneling Image Comparison
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self-directed
learning |
01.Participation in professional forums, lectures, and corporate sharing sessions related to industry-government-academia-research exchange activities.
03.Preparing presentations or reports related to industry and academia.
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| Attendance and Project Report |
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| Sustainable Development Goals, SDGs(Link URL) |
| include experience courses：N |
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