| Relevance of Course Objectives and Core Learning Outcomes(%) |
Teaching and Assessment Methods for Course Objectives |
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Competency Indicators |
Ratio(%) |
Teaching Methods |
Assessment Methods |
本課程介紹掃描式電子顯微鏡(SEM)的儀器原理及其應用於材料化學組成、微結構之分析方法。期藉由本課程的修習讓學生充分了解各項設備的功能，進而活用於其研究工作。
This course introduces the principles of Scanning Electron Microscopy (SEM) and its applications in the analysis of material chemical composition and microstructure. By completing this course, students will gain a thorough understanding of the functionalities of various equipment, enabling them to effectively apply these tools in their research work.
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Course Content |
| Week 1 |
掃描式電子顯微鏡(SEM)
- SEM儀器構造與成像原理
- 電子束與材料之作用
- 二次電子影像(SEI)
- 背向散射電子影像(BEI)
- X光能譜儀(EDS)
Scanning Electron Microscope (SEM)
-Structure and Imaging Principles of SEM Instruments
-Interaction of Electron Beam with Materials
-Secondary Electron Imaging (SEI)
-Backscattered Electron Imaging (BEI)
-X-ray Spectroscopy (EDS)
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self-directed
learning |
01.Participation in professional forums, lectures, and corporate sharing sessions related to industry-government-academia-research exchange activities.
03.Preparing presentations or reports related to industry and academia.
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| Sustainable Development Goals, SDGs(Link URL) |
| include experience courses：N |
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