Relevance of Course Objectives and Core Learning Outcomes(%) |
Teaching and Assessment Methods for Course Objectives |
Course Objectives |
Competency Indicators |
Ratio(%) |
Teaching Methods |
Assessment Methods |
Understanding Surface Analysis Instrumentation |
1.Professional knowledge and skills |
2.Self-learning abilities and skills |
3.Abilities of clearly expressing research results |
4.Problem analysis and logical deduction |
|
|
Exercises |
Discussion |
Lecturing |
Practicum |
|
Oral Presentation |
Written Presentation |
Quiz |
|
Course Content and Homework/Schedule/Tests Schedule |
Week |
Course Content |
Week 1 |
Introduction to Nanoscience and Nanotechnology
|
Week 2 |
Nanotechnology in real space |
Week 3 |
OM and TEM |
Week 4 |
Scanning Electron Microscopy and EDS |
Week 5 |
Surface Analysis with Real Space Microscopy |
Week 6 |
Field emission microscope (FEM) and field ion microscopes (FIM) |
Week 7 |
Scanning Tunneling Microscopy |
Week 8 |
Scanning Tunneling Microscopy |
Week 9 |
Midterm Exam |
Week 10 |
Atomic Force Microscopy |
Week 11 |
Atomic Force Microscopy |
Week 12 |
Conductive AFM, EFM and SCM |
Week 13 |
Scanning Probe Microscopy:MFM |
Week 14 |
Scanning Probe Microscopy:SNOW |
Week 15 |
SPM Lithography |
Week 16 |
Final Presentaion |
Week 17 |
Self-Learning: PBL Learning |
Week 18 |
Self-Learning: PBL learning |
|
Evaluation |
midterm 20%
presentation 1 25%
report 1 15%
presentation (project) 25%
report 2 15% |
Textbook & other References |
notes |
Teaching Aids & Teacher's Website |
|
Office Hours |
|
Sustainable Development Goals, SDGs |
04.Quality Education   05.Gender Equality   08.Decent Work and Economic Growth   10.Reduced Inequalities | include experience courses:Y |
|