| 課程簡述 |
This comprehensive course dives into the analysis and characterization of thin film optoelectronic materials, focusing on solar cells. Starting with the fundamental principles of solar cells and their performance parameters, students will gain an understanding of key concepts such as current-voltage (J-V) characteristics and External Quantum Efficiency (EQE).The curriculum includes detailed study of Photoluminescence Spectroscopy and Time-Correlated Single Photon Counting (TCSPC) to comprehend charge carrier dynamics within materials. It also introduces X-ray Diffraction (XRD), Scanning Electron Microscopy (SEM), and Atomic Force Microscopy (AFM) for structural and surface analysis of thin films. Further, students will learn Kelvin Probe and Surface Photovoltage techniques to evaluate work function and photo-induced surface potential changes. Photoemission Spectroscopy (PES) and X-ray Photoelectron Spectroscopy (XPS) will be covered, offering insights into the electronic structure of materials. Throughout the course, students will apply these techniques to real-world cases, analyze data, and interpret findings relevant to optoelectronic material optimization. This course is ideal for advanced undergraduate and graduate students in physics, materials science, electrical engineering, or related fields. Prior knowledge of solid-state physics and optoelectronics is recommended. |