| 週次 |
授課內容 |
| 第1週 |
Introduction to Surface Science
On the technical side, we will discuss vacuum technology, surface analytical instruments, and their analytical methods, including scanning probe microscopy, field ion microscopy, low-energy electron diffraction, Auger electron spectroscopy, photoelectron spectroscopy, secondary ion mass spectrometry, and make comparisons with conventional methods for studying material properties. |
| 第2週 |
Understanding nanoscience and surface science analytical instruments |
| 第3週 |
UHV(ultra-high-vacuum) techniques
atomic-scale structure and defects
|
| 第4週 |
microscopic v.s. nanoscopic
|
| 第5週 |
XRD: X-ray diffraction |
| 第6週 |
Surface scattering
|
| 第7週 |
LEED(low energy electron diffraction) |
| 第8週 |
RHEED: Reflection high energy electron diffraction |
| 第9週 |
midterm presentation |
| 第10週 |
Medium energy electron diffraction
|
| 第11週 |
HEIS: High energy ion scattering
ISS: Ion scattering spectroscopy
|
| 第12週 |
UPS: Ultraviolet photoelectron/photoemission spectroscopy
|
| 第13週 |
AES: Auger electron spectroscopy |
| 第14週 |
SIMS: Secondary ion mass spectrometry |
| 第15週 |
ESCA: Electron spectroscopy for chemical analysis (same as XPS)
|
| 第16週 |
EELS: Electron energy loss spectroscopy (same as ELS)
CVD: Chemical vapor deposition
MOCVD: Metal-organic chemical vapor deposition
Final exam
|
自主學習 內容 |
   01.參與專業論壇、講座、企業分享等產官學研相關交流活動    03.製作專題報告    05.參與本校各單位舉辦之各類工作坊活動
|